EDFtest: Goodness of Fit Based on Empirical Distribution Function

This repository contains software for the calculation of goodness-of-fit test statistics and their P-values. The three statistics computed are the Empirical Distribution function statistics called Cramer-von Mises, Anderson-Darling, and Watson statistics. The statistics and their P-values can be used to assess an assumed distribution.The following distributions are available: Uniform, Normal, Gamma, Logistic, Laplace, Weibull, Extreme Value, and Exponential.

Version: 0.1.0
Depends: R (≥ 3.5.0)
Imports: CompQuadForm (≥ 1.4.3), rmutil (≥ 1.1.5), stats
Suggests: knitr, rmarkdown, stringi, testthat (≥ 3.0.0)
Published: 2021-10-25
DOI: 10.32614/CRAN.package.EDFtest
Author: Li Yao [aut, cre], Richard Lockhart [aut]
Maintainer: Li Yao <yaoliy at sfu.ca>
BugReports: https://github.com/LiYao-sfu/EDFtest/issues
License: MIT + file LICENSE
NeedsCompilation: no
Materials: README NEWS
CRAN checks: EDFtest results


Reference manual: EDFtest.pdf
Vignettes: EDFtest-vignette


Package source: EDFtest_0.1.0.tar.gz
Windows binaries: r-devel: EDFtest_0.1.0.zip, r-release: EDFtest_0.1.0.zip, r-oldrel: EDFtest_0.1.0.zip
macOS binaries: r-release (arm64): EDFtest_0.1.0.tgz, r-oldrel (arm64): EDFtest_0.1.0.tgz, r-release (x86_64): EDFtest_0.1.0.tgz, r-oldrel (x86_64): EDFtest_0.1.0.tgz


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